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eeprom_stm32: implement high density wear leveling (#12567)

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* eeprom_stm32: implement wear leveling
Update EECONFIG_MAGIC_NUMBER
eeprom_stm32: check emulated eeprom size is large enough
* eeprom_stm32: Increasing simulated EEPROM density on stm32
* Adding utility script to decode emulated eeprom
* Adding unit tests
* Applying qmk cformat changes
* cleaned up flash mocking
* Fix for stm32eeprom_parser.py checking via signature with wrong base
* Fix for nk65 keyboard

Co-authored-by: Ilya Zhuravlev <whatever@xyz.is>
Co-authored-by: zvecr <git@zvecr.com>
This commit is contained in:
Donald Kjer 2021-08-23 15:15:34 -07:00 • committed by GitHub
parent 2481e109a0
commit e756a21636
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GPG key ID: 4AEE18F83AFDEB23
12 changed files with 1549 additions and 197 deletions
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23
tmk_core/common/test/rules.mk Normal file
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eeprom_stm32_DEFS := -DFLASH_STM32_MOCKED -DNO_PRINT -DFEE_FLASH_BASE=FlashBuf
eeprom_stm32_tiny_DEFS := $(eeprom_stm32_DEFS) \
-DFEE_MCU_FLASH_SIZE=1 \
-DMOCK_FLASH_SIZE=1024 \
-DFEE_PAGE_SIZE=512 \
-DFEE_DENSITY_PAGES=1
eeprom_stm32_large_DEFS := $(eeprom_stm32_DEFS) \
-DFEE_MCU_FLASH_SIZE=64 \
-DMOCK_FLASH_SIZE=65536 \
-DFEE_PAGE_SIZE=2048 \
-DFEE_DENSITY_PAGES=16
eeprom_stm32_INC := \
$(TMK_PATH)/common/chibios/
eeprom_stm32_tiny_INC := $(eeprom_stm32_INC)
eeprom_stm32_large_INC := $(eeprom_stm32_INC)
eeprom_stm32_SRC := \
$(TMK_PATH)/common/test/eeprom_stm32_tests.cpp \
$(TMK_PATH)/common/test/flash_stm32_mock.c \
$(TMK_PATH)/common/chibios/eeprom_stm32.c
eeprom_stm32_tiny_SRC := $(eeprom_stm32_SRC)
eeprom_stm32_large_SRC := $(eeprom_stm32_SRC)